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Planar reactive near-field scanning system at KRISS

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5 Author(s)
Dong-Joon Lee ; Center for Electromagnetics, Division of Physical Metrology, Korea Research Institute of Standards and Science, (KRISS), P.O. Box 102, Yusong, Daejeon 305-600, Korea ; No-Weon Kang ; Jae-Yong Kwon ; Joo-Gwang Lee
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A photonic-assisted reactive near-field scanner for planar antennas is presented. We, KRISS (Korea Research Institute of Standards and Science), have recently developed electro-optic sensors as all-dielectric electric field probes and utilized them for field imaging of antenna patterns. The performance of our system, as well as calibration of the system drift, are introduced by exploring 4 × 4 patch antenna arrays at the K-band.

Published in:

CPEM 2010

Date of Conference:

13-18 June 2010