Referenced Items are not available for this document.
This paper describes the development of adaptive test in response to the ever growing need to dynamically and cost effectively tailor IC testing to discriminately manage manufacturing process variations. Various degrees of adoption are presented, together with benefits and examples of it's use. Finally, challenges for future development are discussed.
Published in:
Test Symposium (ETS), 2010 15th IEEE European
Date of Conference: 24-28 May 2010
- Page(s):
- 12 - 16
- ISSN :
- 1530-1877
- E-ISBN :
- 978-1-4244-5833-2
- Print ISBN:
- 978-1-4244-5834-9
- INSPEC Accession Number:
- 11432665
- Conference Location :
- Praha
- Digital Object Identifier :
- 10.1109/ETSYM.2010.5512789
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