Cart (Loading....) | Create Account
Close category search window
 

Equivalent-Input-Disturbance Approach—Analysis and Application to Disturbance Rejection in Dual-Stage Feed Drive Control System

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Jin-hua She ; Sch. of Comput. Sci., Tokyo Univ. of Technol., Tokyo, Japan ; Xin Xin ; Yaodong Pan

This paper deals with the high-precision positioning control of a dual-stage feed drive. The design of the control system is based on the equivalent input-disturbance (EID) approach to improve the disturbance rejection performance. An analysis of the EID approach reveals the mechanism of disturbance rejection. The design procedure is illustrated by a numerical example. Simulation results show that the EID control system not only rejects disturbances, but also suppresses uncertainties and nonlinearities in the plant. Design and simulation results for the example are also employed to compare our method with the disturbance observer method, and to demonstrate the validity of our method.

Published in:

Mechatronics, IEEE/ASME Transactions on  (Volume:16 ,  Issue: 2 )

Date of Publication:

April 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.