By Topic

A technique for measuring the energy resolution of low-Z scintillators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

10 Author(s)
Roemer, K. ; ICx Technol. GmbH, Solingen, Germany ; Pausch, G. ; Herbach, C. ; Yong Kong
more authors

Scintillator-based Compton cameras for remote localization and identification of radio nuclides require scatter detectors made of low-Z materials. The energy resolution of such detectors in a range dominated by Compton scattering is a crucial parameter. It has to be known for performance estimates, and it must be quantified and optimized for detector designs to be used in real systems, but it is hard to measure. The Compton Coincidence Technique (CCT) appears to be the best method for reliable and direct measurements, but appropriate facilities are expensive. This paper suggests and investigates a modified CCT which provides less expensive means for qualifying of scatter detectors in a reasonable time frame. The assembly consists of a single HPGe detector, the scatter detector to be investigated, and one or more common gamma sources in close geometry. Pulse height and timing information from both detectors is gathered by multi-parameter data acquisition. Coincidences of both detectors are due to a plurality of Compton scattering angles and corresponding energy transfers. A thorough data analysis then allows extracting the detector resolution as well as the non-linearity as a function of energy from data sets measured within hours. Results obtained for NaI and plastic scatter detectors will be presented and discussed.

Published in:

Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE

Date of Conference:

Oct. 24 2009-Nov. 1 2009