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Electrical Instability of RF Sputter Amorphous In-Ga-Zn-O Thin-Film Transistors

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4 Author(s)
Fung, Tze-Ching ; Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA ; Abe, K. ; Kumomi, H. ; Kanicki, Jerzy

Bias-temperature-stress (BTS) induced electrical instability of the RF sputter amorphous In-Ga-Zn-O (a-IGZO) thin-film transistors (TFTs) was investigated. Both positive and negative BTS were applied and found to primarily cause a positive and negative voltage shift in transfer (I DS-V GS) characteristics, respectively. The time evolution of bulk-state density (N BS) and characteristic temperature of the conduction-band-tail-states (TG) are extracted. Since both values showed only minor changes after BTS, the results imply that observed shift in TFT I DS-V GS curves were primarily due to channel charge injection/trapping rather than defect states creation. We also demonstrated the validity of using stretch-exponential equation to model both positive and negative BTS induced threshold voltage shift (DeltaV th) of the a-IGZO TFTs. Stress voltage and temperature dependence of DeltaV th evolution are described.

Published in:

Display Technology, Journal of  (Volume:5 ,  Issue: 12 )

Date of Publication:

Dec. 2009

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