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Integration of IEEE STD.11149.1 and mixed-signal test architectures

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2 Author(s)
Cheek, D.J. ; Dept. of Electr. & Comput. Eng., Colorado Univ., Colorado Springs, CO, USA ; Dandapani, R.

It is shown that the TMS pin of IEEE Std. 1149.1 can also be-used for providing stimulus during analog measurements using the architectures of [Park93] and [Lu94]. This results in the saving of one test pin for these architectures. Simulation results show that mixed-signal testing can be safely performed using the new approach without compromising the effectiveness of the approaches of [Park93] and [Lu94]

Published in:

Test Conference, 1995. Proceedings., International

Date of Conference:

21-25 Oct 1995