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Do you practice safe test? What we found out about your habits

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2 Author(s)
Dean, C.A. ; AT&T Bell Labs., Merrimack Valley, MA, USA ; Zorian, Y.

In this paper we look at the results of a yearlong benchmarking effort in the area of IC-level design for testability (DFT). While visiting 10 leading edge companies, we looked at things such as their testability policies, reviews, process for adding testability, their intervals, fault coverage results, and if and where in the system the IC-level self-test was used

Published in:

Test Conference, 1994. Proceedings., International

Date of Conference:

2-6 Oct1994

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