Referenced Items are not available for this document.
An IDDQ based scheme has been presented for concurrent built-in self-test of MCM interconnects. The scheme detects interconnect faults while the system is on-line
Published in:
Test Conference, 1994. Proceedings., International
Date of Conference: 2-6 Oct1994
- Page(s):
- 670 - 676
- Meeting Date :
- 02 Oct 1994-06 Oct 1994
- ISSN :
- 1089-3539
- Print ISBN:
- 0-7803-2103-0
- INSPEC Accession Number:
- 4847035
- Conference Location :
- Washington, DC
- Digital Object Identifier :
- 10.1109/TEST.1994.528012
- Product Type:
- Conference Publications
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