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An intelligent software-integrated environment of IC test

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3 Author(s)
Yuning Sun ; Inst. of Comput. Technol., Acad. Sinica, Beijing, China ; Xiaoming Wang ; WanChun Shi

The migration and simulation of IC test programs among the heterogeneous ATE systems are a very difficult task. An unifying IC test software-integrated environment from simulation to test for digital circuit has been developed. The environment, TeDS which is designed by using object-oriented paradigm, supports two kinds of CAD systems and three kinds of ATE (Automatic Test Equipment). The paper focuses on issues and techniques in developing TeDS based on object-oriented paradigm

Published in:

Test Conference, 1994. Proceedings., International

Date of Conference:

2-6 Oct1994