Close category search window
 

Measurement of Effective Free Layer Magnetization Orientation of TMR Sensors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Taratorin, A. ; Integral Solutions Int., Santa Clara, CA, USA

Measurements of thermal magnetization fluctuation noise spectrum in multi-directional magnetic field reveal tilt of effective free layer orientation in TMR sensors. We propose a method for effective sensor stiffness field measurement and demonstrate that deviations of stiffness from nominal values are caused by the angular dependence of the stiffness field. Ferro-magnetic resonance peak measurements indicate that the free layer magnetization orientation may be tilted from the cross-track direction. This magnetization tilt is caused by reference layer, hard bias problems and shape anisotropy effects. This reduces sensor efficiency and leads to amplitude asymmetry, multi-domain configuration and sensor instability. FMR-based method for detection of potentially unstable heads based on these observations is proposed.

Published in:
Magnetics, IEEE Transactions on  (Volume:45 ,  Issue: 10 )

Date of Publication: Oct. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.