Cart (Loading....) | Create Account
Close category search window
 

Optimal Replacement Rate of Devices with Lognormal Failure Distributions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Clheng, S.S. ; Bell Telephone Laboratories, Inc; Holmdel, NJ 07733 USA.

The time dependence of the replacement rate of devices with lognormal failure distributions is studied. The relationship between the peak replacement rate and a, the standard deviation in the corresponding s-normal distribution, is obtained. The study assumes that each device represents a renewal process and the system of devices represents a superimposed renewal process. The peak replacement rate becomes very large for both extreme values of a. The corresponding replacement rate eventually approaches the conventional asymptotic rate only after many MTTFs (Mean Time To Failure), possibly long after the system becomes obsolete. Ways to cope with this situation are suggested. However, the replacement rate curve becomes almost critically damped with a minimum-peak-factor ¿1.03 at ¿ ¿0.63. The study also reveals that asymptotically the lognormal devices with ¿ << 1 would require fewer replacements than the exponential devices with the same MTTF. The difference is equal to one-half of the population in service. For large a, more replacements are required. The results of this paper apply to a variety of reliability studies and maintenance and inventory strategies for communication systems that employ lognormal devices such as a semiconductor laser, LED, avalanche photo diode, or IMPATT diode. In particular, the present approach is especially helpful when such a device is the least reliable component in the system.

Published in:

Reliability, IEEE Transactions on  (Volume:R-26 ,  Issue: 3 )

Date of Publication:

Aug. 1977

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.