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Voltage-comparator-based measurement of equivalently sampled substrate noise waveform in mixed-signal integrated circuits

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5 Author(s)
Makie-Fukuda, K. ; Central Res. Lab., Hitachi Ltd., Tokyo, Japan ; Anbo, T. ; Tsukada, T. ; Matsuura, T.
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A method is proposed for measuring substrate noise waveforms in mixed-signal integrated circuits. This method uses wideband chopper-type single-ended voltage comparators as on-chip noise detectors. By analyzing the equivalently sampled comparator outputs from synchronized operation, the noise voltages in auto-zero and compare modes can be separately detected and the noise waveforms can be reconstructed within 2-nsec accuracy. The measured results also explain the influence of noise coupling on analog circuits widely used in on-chip analog to digital converters.

Published in:

VLSI Circuits, 1995. Digest of Technical Papers., 1995 Symposium on

Date of Conference:

8-10 June 1995