Referenced Items are not available for this document.
This paper presents the results of alpha single event upsets tests of an embedded 8051 microprocessor. Cross sections for the different memory resources (i.e., internal registers, code RAM, and user memory) are reported as well as the error rate for different codes implemented as test benchmarks. Test results are then discussed to find the contribution of each available resource to the overall device error rate.
Published in:
On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
Date of Conference: 24-26 June 2009
- Page(s):
- 69 - 74
- E-ISBN :
- 978-1-4244-4595-0
- Print ISBN:
- 978-1-4244-4596-7
- INSPEC Accession Number:
- 10826660
- Conference Location :
- Sesimbra, Lisbon
- Digital Object Identifier :
- 10.1109/IOLTS.2009.5195985
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
