Cart (Loading....) | Create Account
Close category search window
 

Testing self-timed circuits using partial scan

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Khoche, A. ; Dept. of Comput. Sci., Utah Univ., Salt Lake City, UT, USA ; Brunvand, E.

This paper presents a partial scan method for testing both the control and data path parts of macromodule based self-timed circuits for stuck-at faults. Compared with other proposed test methods for testing control paths in self-timed circuits, this technique offers better fault coverage under a stuck-at input model than methods using self-checking properties, and requires fewer storage elements to be made scannable than full scan approaches with similar fault coverage. A new method is proposed to test the sequential network in the control path in this partial scan environment. The partial scan approach has also been applied to data paths, where structural analysis is used to select which latches should be made scannable to break cycles in the circuit. Experimental data is presented to show that high fault coverage is possible using this method with only a subset of storage elements in the control and data paths being made scannable

Published in:

Asynchronous Design Methodologies, 1995. Proceedings., Second Working Conference on

Date of Conference:

30-31 May 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.