Referenced Items are not available for this document.
We examine stuck-at faults in several gate circuits realizing the C-element. We exhibit circuits with the following phenomena: (a) 50% of single faults do not cause the circuit to halt. (b) Some faults are not detectable by logic tests. (c) A test of length seven is required to detect all detectable single faults. (d) A fault may result in an oscillation. (e) A fault may destroy the speed-independence of a circuit. We also analyze static and dynamic CMOS implementations of the C-element
Published in:
Asynchronous Design Methodologies, 1995. Proceedings., Second Working Conference on
Date of Conference: 30-31 May 1995
- Page(s):
- 150 - 159
- Meeting Date :
- 30 May 1995-31 May 1995
- Print ISBN:
- 0-8186-7098-3
- INSPEC Accession Number:
- 5044982
- Conference Location :
- London
- Digital Object Identifier :
- 10.1109/WCADM.1995.514652
- Product Type:
- Conference Publications
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