Close category search window
 

Field trials of ECPINS vessel positioning algorithm

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Baziw, E. ; Offshore Syst. Ltd., North Vancouver, BC, Canada

Since 1979, Offshore Systems Ltd. (OSL) has been involved in the development of electronic chart display and information systems (ECDIS). OSL's ECDIS is called the Electronic Chart Precise Integrated Navigation System (ECPINS). The accurate positioning of a vessel is a paramount requirement for an ECDIS. OSL's engineering department has expended considerable effort in the application of Kalman filtering techniques for the integration of several marine navigation measurements which are used for estimating a vessel's position and kinematics. This paper gives an overview of OSL's positioning Kalman filter (PKF), and outlines the different modes of operation depending on which marine navigation measurements are available. Performance results, of the PKF, based on field trials using OSL's vessel, “the MV Surveyor”, navigating within Vancouver, B.C., Harbour, are also presented in this paper

Published in:
Position Location and Navigation Symposium, 1996., IEEE 1996

Date of Conference: 22-26 Apr 1996

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.