IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > VLSI Circuits, 1996. Digest o ... Help

A 2/sup nd/-order double-sampled /spl Delta//spl Sigma/ modulator with individual-level averaging

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Thanh, C. ; Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA ; Lewis, S.H. ; Hurst, P.J.

Delta-sigma modulators (/spl Delta//spl Sigma/Ms) can provide high-resolution, high-linearity analog-to-digital conversion without accurately matched passive components. With a second-order modulator, the signal-to-quantization-noise ratio increases with the oversampling ratio by 15 dB/octave. Therefore, maximizing the sample rate for a given signal bandwidth is important in high-resolution applications. To increase the sample rate by an amount close to the ideal maximum of 100%, individual-level averaging (ILA) can be used. ILA is a dynamic-element matching technique that has been shown to improve the linearity of /spl Delta//spl Sigma/Ms with multibit feedback. In this paper the use of ILA in a double-sampled /spl Delta//spl Sigma/M is described.

Published in:
VLSI Circuits, 1996. Digest of Technical Papers., 1996 Symposium on

Date of Conference: 13-15 June 1996

Page(s):
100 - 101
Meeting Date :
13 Jun 1996-15 Jun 1996
Print ISBN:
0-7803-3339-X
INSPEC Accession Number:
5443042
Conference Location :
Honolulu, HI, USA
Digital Object Identifier :
10.1109/VLSIC.1996.507730
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.