Scheduled System Maintenance:
On Wednesday, July 29th, IEEE Xplore will undergo scheduled maintenance from 7:00-9:00 AM ET (11:00-13:00 UTC). During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Observation of Shapiro-Steps in AFM-Plough Micron-Size YBCO Planar Constrictions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Srinivasu, V.V. ; Stellenbosch Univ., Stellenbosch, South Africa ; Perold, W.J.

Using an atomic force microscope (AFM), we successfully ploughed micron size planar constriction type junctions on YBa2Cu3O7-x thin films. The 100 nanometer (nm) thin films are deposited on MgO substrates by an inverted cylindrical magnetron (ICM) sputtering technique. The films are then patterned into 8-10 micron size strips, using photolithography and dry etching. A diamond coated tip was used with the AFM in this process. We were able to observe well defined current-voltage (I-V) characteristics and Shapiro-steps, successfully demonstrating a possible Josephson effect in these constrictions.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:19 ,  Issue: 3 )