Skip to Main Content
We report on the fabrication and properties of sub-micron YBa2Cu3O7-x off-axis biepitaxial junctions. The vision behind this work is to set up a reliable nanotechnology processing to improve junctions' performances and reproducibility through the reduction of their size. We will illustrate the fabrication procedure employed and show the results obtained on samples where the transport parameters were tuned in a predictable way. Also, proofs of a clean barrier structure with few facets and low disorder were obtained.