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The turn-on field distribution of emission sites in carbon nanotube (CNT) film are measured by counting lighting dots. This provides a convenient method to characterize the field-emission uniformity of a CNT cathode. With this method, a quantitative characterization of the emission-uniformity improvement of a printed CNT film after a conditioning is obtained. The turn-on field distribution of an array of CNT dots in a pixel also can be measured with this method.
Published in:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
(Volume:26
,
Issue:
1
)
Date of Publication: Jan 2008