Close category search window
 

Stabilization of zinc-blende cubic AlN in AlN/W superlattices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kim, I.W. ; Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208 ; Madan, A. ; Guruz, M.W. ; Dravid, V.P.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1116/1.1372897 

AlN/W superlattices with bilayer periods of 3.5–7 nm were grown on MgO (001) by magnetron sputtering. For AlN thicknesses lAlN≤1.5 nm, a cubic phase of AlN was observed using high-resolution cross-sectional transmission electron microscopy and x-ray diffraction (XRD). Pole-figure XRD scans showed a reflection that matched the theoretically predicted interplanar spacing of zinc-blende phase (Zb-AlN), and that could not be explained by either the wurtzite or rocksalt structures. The stabilization of zb–AlN is explained as a result of good interfacial matching between W(100) and zb–AlN(011). When lAlN was increased above 1.5 nm, XRD scans showed a rapid decrease in satellite peak intensities, indicating a degradation of the layered structure, and the appearance of a wurtzite structure. © 2001 American Vacuum Society.

Published in:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films  (Volume:19 ,  Issue: 5 )

Date of Publication: Sep 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.