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On-Die Power Supply Noise Measurement Techniques

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4 Author(s)
Alon, E. ; Dept. of Electr. Eng. & Comput. Sci., Univ. of California-Berkeley, Berkeley, CA ; Abramzon, V. ; Nezamfar, B. ; Horowitz, M.

This paper presents techniques for characterizing wide-band on-chip power supply noise using only two on-chip low-throughput samplers. The properties of supply noise and their associated measurement techniques are reviewed to show how this can be achieved. An initial design of the samplers uses high-resolution VCO-based analog-to-digital converters, and experimental results from a test-chip verify the efficacy of the measurement techniques. To enable simple sampler designs to be used even in aggressively scaled process technologies, measurement systems based on dithered low-resolution samplers are also developed and experimentally characterized.

Published in:

Advanced Packaging, IEEE Transactions on  (Volume:32 ,  Issue: 2 )

Date of Publication:

May 2009

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