By Topic

Contingency severity assessment for voltage security using non-parametric regression techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Wehenkel, L. ; Inst. Montefiore, Liege Univ., Belgium

This paper proposes a novel approach to power system voltage security assessment exploiting nonparametric regression techniques to extract simple, and at the same time reliable, models of the severity of a contingency, defined as the difference between pre- and post-contingency load power margins. The regression techniques extract information from large sets of possible operating conditions of a power system screened offline via massive random sampling, whose voltage security with respect to contingencies is pre-analyzed using an efficient voltage stability simulation. In particular, regression trees are used to identify the most salient parameters of the pre-contingency topology and electrical state which influence the severity of a given contingency, and to provide a first guess transparent approximation of the contingency severity in terms of these latter parameters. Multilayer perceptrons are exploited to further refine this information. The approach is demonstrated on a realistic model of a large scale voltage stability limited power system, where it shows to provide valuable physical insight and reliable contingency evaluation. Various potential uses in power system planning and operation are discussed

Published in:

Power Systems, IEEE Transactions on  (Volume:11 ,  Issue: 1 )