Cart (Loading....) | Create Account
Close category search window
 

Planetary sample sealing for caching

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Backes, P. ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA ; Onstott, T. ; Bar-Cohen, Y. ; Badescu, M.
more authors

A sample sealing technique was developed and tested for a possible Mars Sample Return mission application. The effect on the scientific viability of biological samples from storage of samples in a sample container for a long period of time on the Martian surface was also investigated. Sealing techniques were investigated and a soldering concept was developed and tested to provide a hermetic seal between a sample tube and cap. A sample caching subsystem design concept was updated to allow for sealing of sample tubes. A gas-tight vessel was constructed that could be used to simulate environmental conditions that would be experienced by a sample of regolith on Mars and to test the affects of thermal cycling of the vessel on psychrophilic microorganisms embedded in a regolith simulant to assess the degree of deterioration of the microorganisms.

Published in:

Aerospace conference, 2009 IEEE

Date of Conference:

7-14 March 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.