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Single event effect proton and heavy ion test results in support of candidate NASA programs

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11 Author(s)
LaBel, K. ; NASA Goddard Space Flight Center, Greenbelt, MD, USA ; Moran, A. ; Hawkins, D. ; Sanders, A.
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We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft electronics. The variety of analog and digital devices tested includes ADCs, DC-DC converters, DRAMs, linear devices, and microprocessors

Published in:

Radiation Effects Data Workshop, 1995, NSREC '95 Workshop Record., 1995 IEEE

Date of Conference:

19 Jul 1995