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Challenges in analog and mixed-signal fault models

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1 Author(s)
Soma, M. ; Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA

The design and testing of mixed-signal integrated circuits have enjoyed a renaissance in recent years. As is customary with past developments, however, design outpaces testing, and the drive to integrate analog and digital circuits on the same chip exacerbates the test problems. This article reviews the recent results in analog fault modeling-a critical area of mixed-signal testing-and describes the coming challenges for both industrial and university researchers

Published in:

Circuits and Devices Magazine, IEEE  (Volume:12 ,  Issue: 1 )