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Built-In Self-Test of programmable input/output tiles in Virtex-5 FPGAs

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2 Author(s)
Dutton, B.F. ; Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL ; Stroud, C.E.

A built-in self-test (BIST) approach is presented for the logic resources in the programmable input/output (I/O) tiles in Virtex-5 field programmable gate arrays (FPGAs). A total of 15 BIST configurations were developed to test the I/O cell programmable logic resources in all modes of operation. The approach utilizes dedicated I/O buffer bypass routing in the I/O tile such that the BIST is package independent and applicable to all levels of testing from wafer-level to system-level. The approach offers control of BIST execution and maximal diagnostic resolution of faulty I/O tiles for device and package independent testing. Either the boundary scan interface or a simple system-level interface may be used for BIST execution, control, and diagnosis independent of the configuration interface. Experimental results are presented including fault detection capabilities.

Published in:

System Theory, 2009. SSST 2009. 41st Southeastern Symposium on

Date of Conference:

15-17 March 2009