Cart (Loading....) | Create Account
Close category search window
 

An extended completeness condition for exact cone-beam reconstruction and its application

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kudo, H. ; Inst. of Inf. Sci. & Electron., Tsukuba Univ., Ibaraki, Japan ; Saito, T.

The completeness condition is an important concept that specifies the capability of exact image reconstruction from a set of cone-beam projections. Unfortunately, the existing completeness conditions associated with Tuy's (1983), Smith's (1985), and Grangeat's (1991) inversion formulae are too restrictive in various situations where some projections are partially measured. The authors derive an extended completeness condition that improves the existing results. The new condition is a direct consequence of a reconstruction algorithm that is in the form of space-variant filtering followed by cone-beam backprojection. The new condition is less restrictive compared with the existing ones and provides an effective means to incorporate partially measured projections into image reconstruction

Published in:

Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record  (Volume:4 )

Date of Conference:

30 Oct-5 Nov 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.