Cart (Loading....) | Create Account
Close category search window
 

Exact and Approximate Expressions for the Probability of Undetected Errors of Varshamov–Tenengol'ts Codes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Baldi, M. ; Dept. of Biomed. Eng., Polytech. Univ. of Marche, Ancona ; Chiaraluce, F. ; Klove, T.

Computation of the undetected error probability for error detecting codes over the Z-channel is an important issue, explored only in part in previous literature. In this paper, Varshamov-Tenengol'ts (VT) codes are considered. First, an exact formula for the probability of undetected errors is given. It can be explicitly computed for small code lengths (up to approximately 25). Next, some lower bounds that can be explicitly computed up to almost twice this length are studied. A comparison to the Hamming codes is given. It is further shown that heuristic arguments give a very good approximation that can easily be computed even for large lengths. Finally, Monte Carlo methods are used to estimate performance for long code lengths.

Published in:

Information Theory, IEEE Transactions on  (Volume:54 ,  Issue: 11 )

Date of Publication:

Nov. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.