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Single Event Effects and Total Dose Test Results for TI TLK2711 Transceiver

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3 Author(s)
R. Koga ; Aerosp. Corp., El Segundo, CA ; P. Yu ; J. George

TLK2711 transceivers belonging to the Class V dice manufactured by Texas Instruments were tested for their sensitivity to radiation. We measured single event effects as well as total ionizing dose effects.

Published in:

2008 IEEE Radiation Effects Data Workshop

Date of Conference:

14-18 July 2008