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Fault detection for single and multiple missing-gate faults in reversible circuits

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4 Author(s)
Xiao Fang-ying ; Sch. of Comput. Sci. & Eng., Southeast Univ., Nanjing ; Chen Han-wu ; Liu Wen-jie ; Li Zhi-giang

To ensure the validity and reliability of reversible circuits, fault detection is necessarily. Two methods to get complete test set with respect to missing-gate fault (MGF) in reversible circuits were introduced. They are the method that divided the circuit into subcircuit to get the complete test set which is not minimal and the set covering method to get the minimal complete test set. Comparing to DFT detection method, the methods introduced in this paper do not need additional gates; they do not change the structure of the circuits and do not depend on implement technologies. So, it can be widely applied.

Published in:

Evolutionary Computation, 2008. CEC 2008. (IEEE World Congress on Computational Intelligence). IEEE Congress on

Date of Conference:

1-6 June 2008