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Silicon-chip single and coupled coplanar transmission line measurements and model verification up to 50GHz

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5 Author(s)
Goren, D. ; IBM Haifa Res. Labs, Haifa Univ., Haifa ; Shlafman, S. ; Sheinman, B. ; Woods, W.
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Silicon technology on-chip single and coupled coplanar transmission lines have been measured on wafer up to 50 GHz. De-embedding was performed using various methods including the L-2L technique [1,2] by measuring two transmission lines of original and double length. A novel approach has been used for the measurement of the coupled structures using conventional two port VNA. Results are investigated both in S-parameter format and in gamma-Zo format, and compared with EM solver and the parametric IBM coplanar T-line device models discussed elsewhere [3,4] which are available in IBM CMOS and SiGe technology design kits. A comparison with RC model shows the limits of RC model validity, in frequency domain.

Published in:

Signal Propagation on Interconnects, 2007. SPI 2007. IEEE Workshop on
RFIC Virtual Journal, IEEE

Date of Conference:

13-16 May 2007