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Fabrication and Characteristics of 40-Gb/s Traveling-Wave Electroabsorption Modulator-Integrated DFB Laser Modules

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5 Author(s)
Ho-Gyeong Yun ; Convergence & Components Lab., Electron. & Telecommun. Res. Inst., Daejeon ; Kwang-Seong Choi ; Yong-Hwan Kwon ; Joong-Seon Choe
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We have developed 40-Gb/s traveling-wave electroabsorption-modulator-integrated distributed feedback laser (TW-EML) modules using several advanced technologies. First, we have adopted a selective area growth (SAG) method in the fabrication of the 40-Gb/s EML device to provide active layers for the laser and the electroabsorption modulators (EAMs) simultaneously. The fabricated device shows that the measured 3-dB bandwidth of electrical-to-optical (E/O) response reaches about 45 GHz and the return loss (S11) is kept below -10 dB up to 50 GHz. For the module design of the device, we mainly considered electrical and optical factors. The measured S11 of the fabricated 40 Gb/s TW-EML module is below -10 dB up to about 30 GHz and the 3-dB bandwidth of the E/O response reaches over 35 GHz. We also have developed two types of coplanar waveguide (CPW) for the application of the driver amplifier integrated 40 Gb/s TW-EML module, which is a system-on-package (SoP) composed of an EML device and a driver amplifier device in a module. The measured S11 of the two-step-bent CPW is below -10 dB up to 35 GHz and the measured S11 of the parallel type CPW is below -10 dB up to 39 GHz.

Published in:

IEEE Transactions on Advanced Packaging  (Volume:31 ,  Issue: 2 )