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Thick-film Temperature Sensors and LTCC Substrates - Evaluation and Characterization

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4 Author(s)
Hrovat, M. ; Jozef Stefan Inst., Ljubljana ; Belavic, D. ; Kita, J. ; Holc, J.

The electrical and microstructural characteristics of 1 kohm/sq. thick-film thermistors with high positive (PTC) and negative (NTC) temperature coefficients of resistivity (TCR) fired on "green" LTCC (Low-Temperature Cofired Ceramics) substrates were evaluated. Electrical characteristics, i.e., sheet resistivities, TCRs and noise indices were measured. Microstructures of thick films were investigated by scanning electron microscopy (SEM) and analysed by energy dispersive X-ray analysis (EDS). Functional phases in thermistors were determined by X-ray powder diffraction analysis. Obtained results were compared with characteristics of thick film thermistors fired on relatively inert alumina substrates which were used as a reference.

Published in:
Electronics Technology, 30th International Spring Seminar on

Date of Conference: 9-13 May 2007

Page(s):
65 - 69
E-ISBN :
987-1-4244-1218-1
Print ISBN:
987-1-4244-1218-1
INSPEC Accession Number:
9833037
Conference Location :
Cluj-Napoca
Digital Object Identifier :
10.1109/ISSE.2007.4432822
Product Type:
Conference Publications

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