Cart (Loading....) | Create Account
Close category search window
 

A Reliability Growth Projection Model for One-Shot Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Hall, J.B. ; US Army Evaluation Center, Aberdeen ; Mosleh, A.

This paper offers several contributions to the area of discrete reliability growth projection. We present a new, logically derived model for estimating the reliability growth of complex, one-shot systems (i.e., the reliability following implementation of corrective actions to known failure modes). Multiple statistical estimation procedures are utilized to approximate this exact expression. A new estimation method is derived to approximate the vector of failure probabilities associated with a complex, one-shot system. A mathematically-convenient functional form for the s -expected initial reliability of a one-shot system is derived. Monte-Carlo simulation results are presented to highlight model accuracy with respect to resulting estimates of reliability growth. This model is useful to program managers, and reliability practitioners who wish to assess one-shot system reliability growth.

Published in:

Reliability, IEEE Transactions on  (Volume:57 ,  Issue: 1 )

Date of Publication:

March 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.