By Topic

Low Dose Rate Testing of the Intersil IS1009RH Hardened Voltage Reference and ISL72991RH Negative Low Dropout Regulator

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
van Vonno, N.W. ; Intersil Corp., Melbourne ; Gill, J.S.

We report results of baseline 100 krad(Si) low dose rate testing of the Intersil IS1009RH hardened voltage reference and ISL72991RH negative low dropout regulator. Both parts showed minimal to moderate sensitivity to this environment.

Published in:

Radiation Effects Data Workshop, 2007 IEEE  (Volume:0 )

Date of Conference:

23-27 July 2007