Referenced Items are not available for this document.
TEM cells are widely used for EMC/EMI measurements. However, the electric field strength only at the center point of the cell is roughly estimated. By introducing a passive scatterer into the cell, such as a straight wire, the echo fields can be detected by the deviation of the reflection coefficient from that of the empty cell. This deviation is related to the incident electric field at the location of the scatterer. In this paper, the electric field uniformity of a TEM cell for the dominant and orthogonal polarizations is investigated by the measurement.
Published in:
Electromagnetic Compatibility, 2007. EMC 2007. IEEE International Symposium on
Date of Conference: 9-13 July 2007
- Page(s):
- 1 - 5
- E-ISBN :
- 1-4244-1350-8
- Print ISBN:
- 1-4244-1350-8
- INSPEC Accession Number:
- 9830204
- Conference Location :
- Honolulu, HI
- Digital Object Identifier :
- 10.1109/ISEMC.2007.14
- Product Type:
- Conference Publications
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