Referenced Items are not available for this document.
In this study, the effect of magnetic recording layer thickness on media performance in CoCrPtO perpendicular media was investigated. The thin films were reactively sputter-deposited on NiP-coated Al substrates. Ru/Ta was used as an interlayer and the total thickness of the synthetic antiferromagnetically-coupled SUL was 140 nm. The CoCrPtO layer thickness was varied from 2 to 27 nm. Saturation magnetization (Ms) of the CoCrPtO layer, obtained from a slope of saturation magnetization per unit area versus media thickness (tMAG), was 450 emu/cm3. The film orientation and microstructure were investigated by X-ray diffraction (XRD) and transmission electron microscopy (TEM). Polar magneto-optic Kerr effect (MOKE) magnetometer and vibrating sample magnetometer (VSM) were used to measure the magnetic properties. Recording performance was evaluated by using a spin-stand tester with a single-pole-type writer and a GMR reader.
Published in:
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Date of Conference: 8-12 May 2006
- Page(s):
- 10
- Print ISBN:
- 1-4244-1479-2
- INSPEC Accession Number:
- 9723955
- Conference Location :
- San Diego, CA
- Digital Object Identifier :
- 10.1109/INTMAG.2006.375419
- Product Type:
- Conference Publications
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