Cart (Loading....) | Create Account
Close category search window
 

Data Processing for Tissue Histopathology Using Fourier Transform Infrared Spectral Data

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Keith, F.N. ; Dept. of Bioeng. & Beckman Inst. for Adv. Sci. & Technol., Univ. of Illinois at Urbana-Champaign, Urbana, IL ; Rong Kong ; Pryia, A. ; Bhargava, Rohit

Optical microscopic examination of stained tissue by pathologists is the gold standard for the diagnosis of most cancers. Due to the human element involved, however, the process is slow, decisions are often complicated by subjective opinions and the uncertainty in diagnoses can affect therapy. Infrared spectroscopic imaging or hyperspectral molecular imaging, as opposed to optical wideband imaging, has been proposed as a viable alternative to provide automated, accurate, reproducible and useful diagnoses. Data processing to enable these applications, however, is not straightforward. Here we discuss recent advances in automatically profiling tissue and present the complexity and numerical strategies to address issues involved. Using breast cancer as an example, we show the importance of integrating statistical and mathematical tools into the analysis framework.

Published in:

Signals, Systems and Computers, 2006. ACSSC '06. Fortieth Asilomar Conference on

Date of Conference:

Oct. 29 2006-Nov. 1 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.