Referenced Items are not available for this document.
An in situ measurement scheme for generating supply-noise maps, which can be conducted while running applications in product-level LSIs, was developed. The design of the on-chip voltage sampling probe is based on a simple ring oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High measurement accuracy is achieved by off-chip digital signal processing and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G-cellular-phone processor. It will thus help in designing power-supply networks and in visually verifying the quality of a power supply
Published in:
Solid-State Circuits, IEEE Journal of
(Volume:42
,
Issue:
4
)
Date of Publication: April 2007
- Page(s):
- 784 - 789
- ISSN :
- 0018-9200
- INSPEC Accession Number:
- 9392291
- Digital Object Identifier :
- 10.1109/JSSC.2007.891662
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 26 March 2007
- Issue Date :
- April 2007
- Sponsored by :
- IEEE Solid-State Circuits Society
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