Referenced Items are not available for this document.
A scheme called Φ-test for checking the fidelity of test responses generated by a specially tailored sequence of test inputs is described. Φ-test, which performs the checks without storing the test responses in any manner, can be used for fault diagnosis and isolation in (1) embedded combinational or sequential logic, and (2) a system of units connected via a bus. Unlike signature analysis, Φ-test flags the offending values in case of discrepancy, thereby exposing the test inputs (and by implication, the devices) that generated them
Published in:
Computer Design: VLSI in Computers and Processors, 1993. ICCD '93. Proceedings., 1993 IEEE International Conference on
Date of Conference: 3-6 Oct 1993
- Page(s):
- 588 - 591
- Meeting Date :
- 03 Oct 1993-06 Oct 1993
- Print ISBN:
- 0-8186-4230-0
- INSPEC Accession Number:
- 4955939
- Conference Location :
- Cambridge, MA
- Digital Object Identifier :
- 10.1109/ICCD.1993.393309
- Product Type:
- Conference Publications
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