Cart (Loading....) | Create Account
Close category search window
 

On necessary and sufficient conditions for perfect reconstruction multidimensional delay chain systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Xiang-Gen Xia ; Dept. of Electr. & Comput. Eng., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA ; Suter, B.W. ; Oxley, M.E.

We present some necessary and sufficient conditions for a perfect reconstruction (PR) modified multidimensional (MD) delay chain system. With these results, one is able to systematically check if a D-dimensional delay chain system with a D×D sampling matrix M and a D×D delay matrix L has a PR property in a simpler way than before, where the matrix module operations are avoided. Moreover, given a D×D sampling matrix M, in many cases one can determine all possible D×D delay matrices L so that the delay chain systems with the sampling matrix M have a PR property. Several examples are provided. We also present a method to generate D×D sampling and delay matrices M and L such that their corresponding traditional MD delay chain systems are PR

Published in:

Signal Processing, IEEE Transactions on  (Volume:43 ,  Issue: 6 )

Date of Publication:

Jun 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.