By Topic

Survey of reliability studies of consecutive-k-out-of-n:F and related systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
M. T. Chao ; Inst. of Stat. Sci., Acad. Sinica, Taipei, Taiwan ; J. C. Fu ; M. V. Koutras

The consecutive-k-out-of-n:F and related systems have caught the attention of many researchers since the early 1980s. The studies of these systems lead to better understanding of the reliability of general series systems, In computation and structure. This paper is mainly a chronological survey of computing the reliability of these systems

Published in:

IEEE Transactions on Reliability  (Volume:44 ,  Issue: 1 )