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Dependent and multimode failures in reliability evaluation of extra-stage shuffle-exchange MINs

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3 Author(s)
Trahan, J.L. ; Dept. of Electr. & Comput. Eng., Louisiana State Univ., Baton Rouge, LA, USA ; Wang, D.X. ; Rai, S.

Previous reliability evaluations for multistage interconnection networks (MINs) assumed that “all failures are statistically-independent and that no degraded operational modes exist for switches”, though these assumptions are not realistic. For example, researchers have described instances of statistically-dependent failures, or fault side-effects, in some MINs. This paper presents efficient algorithms for terminal, broadcast, and K-terminal reliability evaluation of the shuffle-exchange network with an extra stage (SENE), a redundant-path MIN, under assumptions that allow statistical-dependence between failures and degraded operational modes for switches. A modified shock-model incorporates failure statistical-dependency and multiple operational modes into the reliability evaluation. For an N×N SENE, the reliability algorithms and their run-times are: terminal and broadcast →O(log(N)), and K-terminal→O(|K|·log(N))

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Reliability, IEEE Transactions on  (Volume:44 ,  Issue: 1 )