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A diagnostic network for massively parallel processing systems

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2 Author(s)
Yoon-Hwa Choi ; Dept. of Comput. Eng., Hong Ik Univ., Seoul, South Korea ; Yu-Seok Kim

Massively parallel processing systems consist of a large number of processing nodes to provide high performance primarily for data-intensive applications. In a system of such dimensions high availability cannot be achieved without relying on redundancy and reconfiguration. An important aspect of highly available design is rapid diagnosis and graceful degradation in the event of a failure. This paper presents a diagnostic network for locating faults in massively parallel processing systems comprised of identical processing nodes

Published in:

Test Symposium, 1994., Proceedings of the Third Asian

Date of Conference:

15-17 Nov 1994