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The effect of built-in current sensors (BICS) on operational and test performance [CMOS ICs]

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4 Author(s)
S. M. Menon ; Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA ; Y. K. Malaiya ; A. P. Jayasumana ; C. Q. Tong

Effects of built-in current sensors on IDDQ measurement as well as on the performance of the circuit under test are considered. Most of the Built-in Current Sensor designs transform the ground terminal of the circuit under test to a virtual ground. This causes increase in both propagation delay as well as IDDQ sampling time with increase in the number of gates, affecting both test as well as operational performance. The effect that the current sensor has on the operational and test performance is considered. Circuit partitioning may be used for overcoming the effects of BICS on IDDQ measurements as well as on the performance of the circuit under test

Published in:

VLSI Design, 1994., Proceedings of the Seventh International Conference on

Date of Conference:

5-8 Jan 1994