Referenced Items are not available for this document.
A self-contained method with very low bypass storage cell (BSC) overhead is presented. The method uses a graph model to represent the circuit under test. This unifying model makes the method applicable to both the gate level and the module level. A non-necessarily-partitioning technique reduces the number of BSCs considerably
Published in:
Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
Date of Conference: 11-14 Oct 1992
- Page(s):
- 358 - 364
- Meeting Date :
- 11 Oct 1992-14 Oct 1992
- Print ISBN:
- 0-8186-3110-4
- INSPEC Accession Number:
- 4488203
- Conference Location :
- Cambridge, MA
- Digital Object Identifier :
- 10.1109/ICCD.1992.276289
- Product Type:
- Conference Publications
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