By Topic

Piezoelectric devices for frequency control and selection in Japan

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
S. Fujishima ; Murata Manuf. Co. Ltd., Kyoto, Japan

Typical results of the distribution of SAW velocity in a substrate as measured by the line-focus-beam ultrasonic microscope are reported. The designs of oscillator circuits using bulk wave and surface acoustic wave resonators are analyzed. Maximum input power for SAW devices is limited by electrode migration, which depends on the maximum stress at interdigital-transducer electrodes. Stress distribution in a SAW substrate can be calculated and shown graphically by the finite element method. The use of oriented Al electrodes, instead of ordinary amorphous Al electrodes, can increase the life of quartz-crystal SAW resonators over 1000 times. Finally, the reliability of dipped resin packages for TV VIF SAW filters is reported

Published in:

Ultrasonics Symposium, 1990. Proceedings., IEEE 1990

Date of Conference:

4-7 Dec 1990