By Topic

Experimental Measurement of Optical Phase Variance in RZ-DPSK Systems Using Direct Detection After Demodulation by an MZDI

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Boivin, D. ; Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA ; Haris, M. ; Hanna, M. ; Jianjun Yu
more authors

Phase jitter is the major impairment of long-haul phase-shift keying systems. In this letter, we propose and investigate a novel experimental method to estimate the optical phase variance of return-to-zero differential phase-shift-keyed (RZ-DPSK) systems. The means and variances of the power detected before and after DPSK demodulation are the only physical parameters needed to determine the optical phase variance. This can be easily measured with the histogram function of a fast oscilloscope. Numerical simulations confirm a posteriori the accuracy of the method which can be considered as a useful and simple tool to characterize a DPSK transmission

Published in:

Photonics Technology Letters, IEEE  (Volume:18 ,  Issue: 19 )