Referenced Items are not available for this document.
We present a method for extracting the complex permittivity and permeability of dielectric/magnetic thin films in a grounded coplanar waveguide configuration. The technique is applicable for extraction of these material parameters for lossy and lossless materials over a broad frequency range with high accuracy. For validation, we extracted complex permittivity and permeability, using the scattering parameters obtained from the full-wave electromagnetic simulation for two test cases over a frequency range of 5 to 15 GHz. Accuracy for both dielectric as well as magnetic materials is within 2% error.
Published in:
Magnetics, IEEE Transactions on
(Volume:42
,
Issue:
7
)
Date of Publication: July 2006
- Page(s):
- 1929 - 1931
- ISSN :
- 0018-9464
- INSPEC Accession Number:
- 8973566
- Digital Object Identifier :
- 10.1109/TMAG.2006.874098
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 26 June 2006
- Issue Date :
- July 2006
- Sponsored by :
- IEEE Magnetics Society
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